The test cases need to take into account the assembly modifications. The instruction: LdXMemH dst: r2 src: r1 off: 0 imm: 0 has been replaced with: LdXMemW dst: r2 src: r1 off: 0 imm: 0 And32Imm dst: r2 imm: 65535 Signed-off-by: Alice Frosi <afrosi@de.ibm.com> |
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devicefilter | ||
ebpf.go |